Probe Stations
FormFactor Probe Stations, l, made by the world leader in the design and development of wafer and measurement test solutions, allow electrical measurements to be taken to test semiconductor chips and integrated circuits from DC to THz.

Whether you need an affordable manual probe station for taking measurements on samples of up to 150 mm, or semiautomatic solutions for monitoring the temperature and/or pressure of wafers of up to 300 mm, Cascade Microtech offers high performance solutions for on-wafer, circuit board, riser card, MEMS and optoelectronic device measurements, providing highly reliable data.

In addition to the probe station, eNGN provides accessories such as thermal control systems, measuring probes, micromanipulators, special cables, WinCal XE calibration software.

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150-mm probe stations

MPS150 manual modular system

Preconfigured EPS150 packages

200-mm probe stations

Semiautomatic solutions, developments for production and manual developments.

ESTACION-PUNTAS-2

PM8 Manual probe station

SEMIAUTOMATIC-BG

Summit Semi Automatic probe system

200-semiautomatic

PA200 semiautomatic probe Station

BLURAY

BlueRay probe system for production

300-mm probe stations

300MM

CM300 scalable automatic probe system

300MM2

ELITE300 Probe Station

300MM3

PM300 Manual probe station

300MM4

PA300 Probes System

Dedicated measurement system

Complete solutions based on Cascade Microtech/FormFactor probe station for various applications such as:

Power device characterisation systems

Vacuum test systems

Cryogenic probe systems

Pressure test systems

Double-sided measuring systems

Production Test systems

Probe station for circuits

Measurements Probes

Cascade Microtech/FormFactor has more than 50 analytical measuring probes for on-wafer, circuit or package measurements, covering ranges from DC to THz. They can also provide custom adaptations of their solutions.
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ACP (Air Coplanar)

Infinity

T-WAVE

Z PROBE

dc

DC:

Power

Parametrics

multidc

Multi DC-RF

photonic

FOTÓNICA

Special Designs

RELIABILITY SYSTEMS Solutions that enable growth depending on the need, from small WLR (wafer-level reliability) applications to large, fully-automated WLR or PLR (package-level reliability) applications .

1164 RELIABILITY TEST SYSTEM

SYMPHONY: ON-WAFER RELIABILITY TEST-SYSTEM

APPLICATION MODULES FOR RELIABILITY TESTING

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VELOX

control platform for probe station

WINCAL XE

intuitive calibration tool for repeatable, accurate and reliable measurements of S-parameters.

LABVIEW INTEGRATION TOOLS

MANUFACTURERS

formfactor

Files to download