FormFactor Probe Stations, made by the world leader in the design and development of wafer and measurement test solutions, allow electrical measurements to be taken to test semiconductor chips and integrated circuits from DC to THz.
Whether you need an affordable manual probe station for taking measurements on samples of up to 150 mm, or semiautomatic solutions for monitoring the temperature and/or pressure of wafers of up to 300 mm, FormFactor offers high performance solutions for on-wafer, circuit board, riser card, MEMS and optoelectronic device measurements, providing highly reliable data.
In addition to the probe station, eNGN provides accessories such as thermal control systems, measuring probes, micromanipulators, special cables, WinCal XE calibration software.
150-MM Probe Stations
- MPS150 manual modular system
- Preconfigured EPS150 packages
200-MM Probe Stations
Semiautomatic solutions, developments for production and manual developments.
PM8 Manual probe station
Summit Semi Automatic probe system
PA200 semiautomatic probe Station
BlueRay probe system for production
300-MM Probe Stations
CM300 scalable automatic probe system
ELITE300 Probe Station
PA300 Manual Probes System
PA300 Probes System
DEDICATED MEASUREMENT SYSTEM
Complete solutions based on FormFactor probe station for various applications such as:
- Power device characterisation systems
- Vacuum test systems
- Cryogenic probe systems
- Double-sided measuring systems
- Production Test systems
- Probe station for circuits
MEASUREMENTS PROBES
FormFactor has more than 50 analytical measuring probes for on-wafer, circuit or package measurements, covering ranges from DC to THz. They can also provide custom adaptations of their solutions.
ACP (Air Coplanar)
- Infinity
- T-WAVE
- Z PROBE
DC
- Power
- Parametrics
Multi DC-RF
FOTÓNICA
SPECIAL DESIGNS
RELIABILITY SYSTEMS Solutions that enable growth depending on the need, from small WLR (wafer-level reliability) applications to large, fully-automated WLR or PLR (package-level reliability) applications .
- 1164 RELIABILITY TEST SYSTEM
- SYMPHONY: ON-WAFER RELIABILITY TEST-SYSTEM
- APPLICATION MODULES FOR RELIABILITY TESTING
SOFTWARE & CALIBRATION
VELOX
control platform for probe station
WINCAL XE
Intuitive calibration tool for repeatable, accurate and reliable measurements of S-parameters.
LABVIEW INTEGRATION TOOLS